STAIR Codes: A General Family of Erasure Codes for Tolerating Device and Sector Failures in Practical Storage Systems

发布时间:2016-01-12浏览次数:16

 

Speaker: Patrick P. C. Lee

Time: 2015-03-27 9:30

Place: Room 632, EE-3 Building, West Campus

 
Abstract:  

Practical storage systems often adopt erasure codes to tolerate device failures and sector failures, both of which are prevalent in the field. However, traditional erasure codes employ device-level redundancy to protect against sector failures, and hence incur significant space overhead. In this talk, I will present a general family of erasure codes called STAIR codes, which efficiently and provably tolerate both device and sector failures without any restriction on the size of a storage array and the numbers of tolerable device failures and sector failures. We propose the upstairs encoding and downstairs encoding methods, which provide complementary performance advantages for different configurations. We conduct extensive experiments to justify the practicality of STAIR codes in terms of space saving, encoding/decoding speed, and update cost. If time is allowed, I will also introduce some of other ongoing research projects on storage systems done in our research group.

 

Short Bio: 

Patrick P. C. Lee received the Ph.D. degree in Computer Science from Columbia University in 2008. He is now an assistant professor of the Department of Computer Science and Engineering at the Chinese University of Hong Kong. He is interested in various applied/systems topics including cloud computing and storage, distributed systems and networks, operating systems, and security/ resilience. His current research interests focus on building dependable storage systems, and in particular, improving the fault tolerance, recovery, security, and performance of different types of storage architectures including cloud file systems and SSDs.